Center for Carbon-Based Electronics Peking University Beijing 100871 ChinaKey Laboratory for the Physics and Chemistry of Nanodevices Department of Electronics Peking University Beijing 100871 China;
National Laboratory of Pattern Recognition Institute of Automation Chinese Academy of Sciences Beijing 100190 ChinaSchool of Future Technology University of Chinese Academy of Sciences Beijing 100049 China;
Center for Carbon-Based Electronics Peking University Beijing 100871 ChinaKey Laboratory for the Physics and Chemistry of Nanodevices Department of Electronics Peking University Beijing 100871 China;
National Laboratory of Pattern Recognition Institute of Automation Chinese Academy of Sciences Beijing 100190 ChinaInstitute of Automation Harbin University of Science and Technology Harbin 150080 China;
Center for Carbon-Based Electronics Peking University Beijing 100871 ChinaKey Laboratory for the Physics and Chemistry of Nanodevices Department of Electronics Peking University Beijing 100871 China;
National Laboratory of Pattern Recognition Institute of Automation Chinese Academy of Sciences Beijing 100190 ChinaSchool of Future Technology University of Chinese Academy of Sciences Beijing 100049 China;
Center for Carbon-Based Electronics Peking University Beijing 100871 ChinaKey Laboratory for the Physics and Chemistry of Nanodevices Department of Electronics Peking University Beijing 100871 China;
Center for Carbon-Based Electronics Peking University Beijing 100871 ChinaKey Laboratory for the Physics and Chemistry of Nanodevices Department of Electronics Peking University Beijing 100871 China;
carbon nanotube; thin films; quality metrology; local anisotropy; transistors;