Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip

著录项

• 来源
  《纳米研究（英文版）》 |2016年第2期|530-536|共7页
• 作者

  Junsuke Yamanishi; Takashi Tokuyama; Yoshitaka Naitoh; Yan Jun Li; Yasuhiro Sugawara;

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• 作者单位

  Department of Applied Physics,Graduate School of Engineering,Osaka University,2-1 Yamada-oka,Suita,Osaka 565-0871,Japan;

  Department of Applied Physics,Graduate School of Engineering,Osaka University,2-1 Yamada-oka,Suita,Osaka 565-0871,Japan;

  Department of Applied Physics,Graduate School of Engineering,Osaka University,2-1 Yamada-oka,Suita,Osaka 565-0871,Japan;

  Department of Applied Physics,Graduate School of Engineering,Osaka University,2-1 Yamada-oka,Suita,Osaka 565-0871,Japan;

  Department of Applied Physics,Graduate School of Engineering,Osaka University,2-1 Yamada-oka,Suita,Osaka 565-0871,Japan;

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• 原文格式 PDF
• 正文语种 eng
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