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METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION

     

摘要

The formula for calculating included angle between polufamily plane traces of lattice systemsin thin foit under hath zero tilt and non-zero tilt states was deduced and verified by certainprat tical examples.The method may be available to index the plane traces of slip.twin andother defects.especially to determine such planar defects as twin

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