Simulation and Analysis of Raw Silk Defects

摘要

To test the reliability and stability of the inspecting program of the electronic inspection system for raw silk,a simulating program is developed to simulate various defect cases with the software tool of Laboratory Virtual Instrument Engineering Workbench(LabVIEW).Many techniques,such as random numbers,shift registers,for loop,case structures and waveforms,are used to facilitate the simulation.The simulated defects are inspected by the inspecting program successfully,which proves the effectiveness of the simulating program.