透射电子显微镜原位双倾样品杆的研制

摘要

The design and fabrication of the double-tilt sample holder for Philips/FEI serial transmission electron microscopes are described here.The test results indicate that the home made double-tilt sample holder satisfies the requirement of TEM analysis and can be employed as the platform to build up the in situ holders.The optical fibers are assembled in the double-tilt holder,guiding the laser shinning on the sample.%本文简述了透射电子显微镜双倾样品杆的基本构造以及双倾台的设计方案,展示了Philips/FEI通用透射电子显微镜双倾样品杆的研制成果.测试表明样品杆的性能基本满足分析工作的要求,并提供了一个很好的原位样品杆的开发平台.在此基础上,研制了光纤双倾样品杆,并将不同波长的激光导入到样品上.