亚共晶Al-Si合金初生相的EBSD表征

摘要

利用电子背散射衍射(EBSD)技术对亚共晶Al-Si合金进行了表征.根据晶界成像图与花样质量成像图提取了初生α-Al相的取向数据,通过合理设置晶界临界值与带衬度值均可获得可靠的结构参数统计结果,提取出的初生α-Al相信息可以方便地分析其含量、形态、尺寸、分布以及取向等信息.%Electron backscatter diffraction technique (EBSD) was used to characterize a hypoeutectic Al-Si Alloy.The orientation data of primary α-Al phase was extracted by grain boundary map and pattern quality map.The reliable statistic results on microstructure parameters can be obtained by setting reasonable grain boundary value and band contrast value.The detailed information of content,morphology,size,distribution,and orientation,etc.can be well analyzed by the obtained results of primary α-Al phase.