HT-6M托卡马克边界杂质循环的研究

摘要

利用多道可见光谱探测系统测量了Hα、CⅢ(464.7 nm)和OⅡ(441.5n nm)谱线的时间行为，得出了碳、氢和氧元素的入射通量。在简化模型下算出了氧碳间的化学溅射率，结果表明HT-6M托卡马克边界杂质产生机制主要是氢氧间的化学溅射和氧碳间的化学溅射，因此控制氧杂质尤其重要。%The influx of carbon, hydrogen and oxygen has been obtained by measuring the time behavior of Hα, CⅢ(464.7 nm) and OⅡ(441.5 nm) line with Multichannel Visible Spectrum Detect System. The sputtering yield between carbon and oxygen has been attained with simplified model. The result shows that impurity production mechanism major is chemical sputtering between hydrogen and oxygen, and between oxygen and carbon at the edge in HT-6M Tokamak. Accordingly it is particularly important to control oxygen impurity contents.