一种低成本UHF RFID芯片集中CP测试方法

摘要

With the rapid development of electronic products, improving the quality of the product, while decreasing product prices is also attended by consumers. Array of electronic products for a low price, the core chip production costs need to be reduced firstly. In passive UHF RFID ( Radio Frequency Identification) area, test cost is large percent of the total cost. Therefore a novel centralized CP test method is proposed. Compared with the current test method, which is testing parallel 8 chips every time, the test time of one group centralized CP test method can be optimized for more than 68%. If changing the number of chips existing in the single test group or adopting multi-groups centralized CP test, the test cost can be cut down substantially, and the market competitiveness of the chip products can be en-hanced.%随着电子产品日新月异的发展，在产品品质提高的同时，产品价格的下降也越来越被消费者重视。为了降低电子产品的价格，首先需要降低核心芯片的生产成本。 UHF RFID芯片的设计成本很低，因此测试成本在芯片生产成本中占有很大比重。为此，提出了一种新颖的集中CP测试方案来降低芯片CP测试的成本。与最基本的8芯片同测方案相比，不仅芯片面积变小，单组集中CP测试方案可对测试时间至少优化68%。如果单个测试单元的芯片个数改变，或者同时采用多组同测，还可以进一步降低测试成本，增强产品的市场竞争力。