基于并行频率测量的TCXO高效测试技术

摘要

The present TCXO test systems are of low test efficiency because of limited frequency measurement capacity.A parallel frequency measurement method based on directly frequency measurement is proposed in this paper and a parallel TCXO test system using this method was developed.At least 100 TCXOs can be measured simultaneously in the proposed test system,and its test capacity can be expanded further.Its frequency measurement error is less than ±4×l0-9 fully meeting the accuracy requirement of the design and production of state-of-the-art TCXOs.The test and production efficiency of TCXOs can be raised using this test system.%当前的温补晶振测试系统受频率测量容量制约,测试效率不高,本文提出了一种基于直接测频法的并行频率测量方法,并采用该方法实现了并行TCXO测试系统.该测试系统已经可以对至少100颗TCXO同时进行测试,且测试容量还可以进一步增加.该测试系统的频率相对测量误差低于±4×10-9,完全符合目前TCXO的设计和生产精度要求.应用该并行测试系统可显著提高TCXO测试与生产的效率.