用于形状记忆材料研究的中子衍射原位温度加载系统

摘要

配合中国工程物理研究院的中子衍射应力谱仪开展形状记忆材料的相关研究,设计了一套原位温度加载系统。该系统可为测量样品提供25~800℃温度环境,温度控制器采用大林改进算法,有效地消除了温度过冲问题。该系统已开展了多次带束测试,结果表明其结构设计适用于中子衍射实验,温度控制在上升阶段无超调、稳态误差为±1℃,满足形状记忆材料的温度加载实验要求。%An in-situ temperature loading system was designed.It can control the sample’s temperature from 25 ℃ to 800℃,and the temperature controller applied improved Dahlin algorithm to inhibit temperature overshoot.The system was tested with neutron beam on the residual stress neutron diffractometer.The result shows that the structure suits for neutron diffraction experiment,and the temperature keeps not higher than the target during the ascending period,and the precision is ±1 ℃ during the stable period,which meets temperature loading requirements for shape memory materials.