镉胁迫下硅对水稻幼苗根生物量及其镉含量的影响

摘要

Effect of silicon under cadmium stress on the biomass and cadmium content of Oryza sativa seedling root was studied by solution culture method to provide theoretical basis for clarifying the remitting mechanism of Si on Cd stress. The results showed that the fresh weight and dry weight of root under Cadmium stress(4 mg/L)showed an increasing trend with the increase of SiO2 concentration (ranging from 30～180 mg/L). When the SiO2 concentration was above 30 mg/L, the root fresh weight and dry weight of different treatments are 68.02％,85.59％,86.63％,84.25％ and 86.25％,92.22％,99.66％,95.99％ of CK(without cadmium stress), respectively. The root dry weight was close to CK when the SiO2 concentration was 130 mg/L. The Cd content of root treated with SiO2 was all lower than CK.%为阐明硅缓解镉对水稻幼苗的毒害机制提供理论依据,采用溶液培养试验,研究不同浓度的硅对镉胁迫下水稻幼苗根生物量及其镉含量的影响.结果表明:在硅镉胁迫下(4 mg/L),SiO2浓度30～180 mg/L范围内,随着浓度的增加,根鲜重和干重呈现出增加趋势,当浓度≥30 mg/L时,根鲜重分别为无镉胁迫处理的68.02%、85.59%、86.63%、84.25%,根干重分别为无镉胁迫处理的86.25%、92.22%、99.66%、95.99%;浓度为130 mg/L时,根的干重接近无镉胁迫处理的生物量;在镉胁迫下,经SiO2缓解的根的镉含量均比无SiO2缓解的低.