非晶硅平板探测器DR成像校正方法

摘要

Correction of flat panel detector is the premise of acquiring high quality digital radiography ( DR) images, X-ray DR imaging experiments were carried out for amorphous silicon flat panel detector of PE0822 in this paper. When the flat panel detector warming up for more than 30 min, the dark image is relatively stable. According to the classification standard of bad pixels, 3 121 points are identified by DR tests, and generate a new map of bad pixels, finally offset correction, gain correction and bad pixel correction were performed for output images of flat panel detector from software. The 1st stage high-pressure turbine blade are used to imaging by flat panel detector, experimental results show that when performed offset correction, gain correction and bad pixel correction, the quality of DR image is improved, the gray value of DR image is between 32 000 and 60 000, and IQI sensitivity can meet the requirements of technology of film radiography, so DR can be used to inspect the body of turbine blade.%平板探测器的校正是获取高质量DR图像的前提,本研究针对PE0822非晶硅平板探测器开展了射线DR成像实验研究。当平板探测器预热30 min以上时,暗场图像比较稳定。根据坏像素的分类标准,实验测试识别了3121个坏点,并制定了新的坏点位置图,最后从软件上实现了平板探测器输出图像的暗场校正、增益校正和坏像素校正。选用高压I级涡轮叶片进行DR成像实验,实验结果表明：经过暗场校正、增益校正和坏像素校正后,提高了DR图像质量,DR图像灰度介于32000~60000之间,且像质计灵敏度达到了胶片照相的工艺要求,可用于涡轮叶片叶身检测。