School of Automation Science and Electrical Engineering Beihang University Beijing 100191 China;
Department of Electronic Engineering Dalian Maritime University Dalian 116026 China;
School of Instrumentation Science and Opto-electronic Engineering&International Research Institute for Multidisciplinary Science Beihang University Beijing 100191 China;
Institute Charles Delaunay-LM2S-UMR STMR 6281 CNRS University of Technology of Troyes Troyes 10010 France;
Abnormal events detection; Abnormal event detection network; Principal component analysis network; Kernel principal component analysis;