首页> 中文期刊> 《中国物理快报:英文版》 >High Conversion Efficiency and Power Stability of 532 nm Generation from an External Frequency Doubling Cavity

High Conversion Efficiency and Power Stability of 532 nm Generation from an External Frequency Doubling Cavity

         

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  • 来源
    《中国物理快报:英文版》 |2012年第9期|87-89|共3页
  • 作者单位

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    41st Instruments of China Electronics Technology Group Corporation, Qingdao 266555;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100013;

    Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084;

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