School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051;