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Terahertz Three-Dimensional Imaging Based on Computed Tomography with Photonics-Based Noise Source

机译:基于计算机断层扫描和光子学噪声源的太赫兹三维成像

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摘要

Computed tomography has been proven to be useful for non-destructive inspection of structures and materials.We build a three-dimensional imaging system with the photonically generated incoherent noise source and the Schottky barrier diode detector in the terahertz frequency band (90-140 GHz).Based on the computed tomography technique,the three-dimensional image of a ceramic sample is reconstructed successfully by stacking the slices at different heights.The imaging results not only indicate the ability of terahertz wave in the noninvasive sensing and non-destructive inspection applications,but also prove the effectiveness and superiority of the uni-traveling-carrier photodiode as a terahertz source in the imaging applications.
机译:计算机断层扫描已被证明可用于结构和材料的非破坏性检查。我们建立了三维成像系统,其光子产生的非相干噪声源和太赫兹频带(90-140 GHz)中的肖特基势垒二极管探测器基于计算机断层扫描技术,通过将不同高度的切片堆叠在一起,成功地重建了陶瓷样品的三维图像。成像结果不仅表明太赫兹波在无创传感和无损检测应用中的能力,而且还证明了单行进载流光电二极管作为太赫兹源在成像应用中的有效性和优越性。

著录项

  • 来源
    《中国物理快报:英文版》 |2017年第8期|76-78|共3页
  • 作者单位

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

    Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences, Shanghai 200050;

  • 收录信息 中国科学引文数据库(CSCD);中国科技论文与引文数据库(CSTPCD);
  • 原文格式 PDF
  • 正文语种 eng
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