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Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

         

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  • 来源
    《中国物理C(英文版)》 |2016年第4期|77-85|共9页
  • 作者单位

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou 510610 China;

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  • 正文语种 eng
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