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Neutron-induced single event upset simulation in Geant4 for three-dimensional die-stacked SRAM

机译:中子诱导的单一事件在GEANT4中为三维模具堆积SRAM中的单一事件镦粗模拟

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  • 来源
    《中国物理:英文版》 |2021年第3期|443-451|共9页
  • 作者单位

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

    Institute of Modern Physics Chinese Academy of Sciences Lanzhou 730000 China;

    University of Chinese Academy of Sciences Beijing 100049 China;

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  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2024-01-06 16:33:16
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