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Analysis of secondary electron emission using the fractal method

机译:使用分形法分析二次电子发射

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  • 来源
    《中国物理:英文版》 |2021年第1期|611-619|共9页
  • 作者单位

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

    National Key Laboratory of Science and Technology on Space Science China Academy of Space Technology (Xi'an) Xi'an 710100 China;

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