首页> 中文期刊> 《中国物理:英文版》 >Atomic force microscopy investigation of growth process of organic TCNQ aggregates on SiO2 and mica substrates

Atomic force microscopy investigation of growth process of organic TCNQ aggregates on SiO2 and mica substrates

         

著录项

  • 来源
    《中国物理:英文版》 |2010年第8期|270-275|共6页
  • 作者单位

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号