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Dielectronic recombination rate coefficient for Cu-like Au50+ ion

机译:类铜Au50 +离子的双电子复合率系数

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摘要

The rate coefficients αDR of dielectronic recombination (DR) for Cu-like Au50+ ion collided with the incident free electron are calculated based on the quasi-relativistic multi-configuration Hartree-Fock theory. The results clearly show that the oDR of all recombination channels exhibits resonance characters with electron temperature. At lower temperatures, the recombination for electrons caused by 4s excitation is dominant through outer electron radiative transitions among the intermediate doubly excited autoionizing levels, in which the most components come from 3d105pns states,whereas with increasing electron temperature, DR caused by 3d excitation turns out to be dominant, and the contribution from the 3d94s4fnf state to the total rate coefficient of electron 3d is the largest with αDR = 1.15 × 10-11 cm3.s-1at an electron temperature of Te=0.35 keV. Under this condition, there exists a strong competition between the two types of recombination channels.
机译:基于准相对论多构型Hartree-Fock理论,计算了与类金Au50 +离子与入射自由电子相撞的双电子复合速率系数αDR。结果清楚地表明,所有重组通道的oDR表现出随电子温度的共振特性。在较低的温度下,由4s激发引起的电子复合通过中间双激发自电离能级之间的外部电子辐射跃迁而占主导地位,其中大多数组分来自3d105pns状态,而随着电子温度的升高,由3d激发引起的DR变为当电子温度为Te = 0.35 keV时,αDR= 1.15×10-11 cm3.s-1,从3d94s4fnf态到电子3d的总速率系数的贡献最大。在这种条件下,两种重组通道之间存在激烈的竞争。

著录项

  • 来源
    《中国物理:英文版》 |2004年第6期|850-854|共5页
  • 作者单位

    Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China;

    Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China;

    Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China;

  • 收录信息 中国科学引文数据库(CSCD);中国科技论文与引文数据库(CSTPCD);
  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类 物理学;
  • 关键词

    Cu-like Au50+ion, dielectronic recombination;

    机译:铜状Au50 +离子;双电子复合;
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