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High-precision two-dimensional atom localization via probe absorption in an M-scheme atomic system

         

摘要

In the present paper,we investigate the behavior of two-dimensional atom localization in a five-level M-scheme atomic system driven by two orthogonal standing-wave fields.We find that the precision and resolution of the atom localization depends on the probe field detuning significantly.And because of the effect of the microwave field,an atom can be located at a particular position via adjusting the system parameters.

著录项

  • 来源
    《中国物理:英文版》 |2013年第4期|264-267|共4页
  • 作者单位

    Institute of Modern Physics, Nanchang University, Nanchang 330031, China;

    Engineering Research Center for Nanotechnology, Nanchang University, Nanchang 330047, China;

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  • 正文语种 eng
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