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High temperature characteristics of bilayer epitaxial graphene field-effect transistors on SiC Substrate

         

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  • 来源
    《中国物理:英文版》 |2016年第6期|463-467|共5页
  • 作者单位

    School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

    National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;

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  • 正文语种 eng
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