School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300130, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;