Simple and practical method of characterizing the parametric down-conversion source

摘要

Parametric down-conversion (PDC) sources play an important role in quantum information processing,therefore characterizing their properties is necessary.Here we present a statistical model to assess the properties of the PDC source with certain distribution,such as the brightness and photon channel transmissions,we only need to measure the singles and coincidences counts in a few seconds.Furthermore,we validate the model by applying it to a PDC source generating highly non-degenerate photon pairs.The results of the experiment indicate that our method is more simple,efficient,and less time consuming.