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Super-resolution and super-sensitivity of entangled squeezed vacuum state using optimal detection strategy

         

摘要

Interference metrology is a method for achieving high precision detection by phase estimation.The phase sensitivity of a traditional interferometer is subject to the standard quantum limit,while its resolution is constrained by the Rayleigh diffraction limit.The resolution and sensitivity of phase measurement can be enhanced by using quantum metrology.We propose a quantum interference metrology scheme using the entangled squeezed vacuum state,which is obtained using the magic beam splitter,expressed as |Ψ> =(|ξ>|0> + |0> |ξ>)/V/2+2/coshr,such as the N00N state.We derive the phase sensitivity and the resolution of the system with Z detection,project detection,and parity detection.By simulation and analysis,we determine that parity detection is an optimal detection method,which can break through the Rayleigh diffraction limit and the standard quantum limit.

著录项

  • 来源
    《中国物理:英文版》 |2017年第9期|204-208|共5页
  • 作者单位

    Harbin Institute of Technology, Harbin 150001, China;

    Harbin Institute of Technology, Harbin 150001, China;

    Harbin Institute of Technology, Harbin 150001, China;

    Harbin Institute of Technology, Harbin 150001, China;

    Harbin Institute of Technology, Harbin 150001, China;

    Tianjin Jinhang Institute of Technology, Tianjin 300192, China;

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  • 正文语种 eng
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