Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
Jiangsu Key Laboratory of ASIC Design, Nantong University, Nantong 226019, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
State Key Laboratory of Transducer Technology, Shanghai 200050, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
State Key Laboratory of Transducer Technology, Shanghai 200050, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
Jiangsu Key Laboratory of ASIC Design, Nantong University, Nantong 226019, China;
Jiangsu Key Laboratory of ASIC Design, Nantong University, Nantong 226019, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
School of Electronic, Electrical, and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;
State Key Laboratory of Transducer Technology, Shanghai 200050, China;
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
School of Electronic, Electrical, and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;