Faculty of Electrical Engineering and Computer Science;
Ningbo University;
Ningbo 315211;
China;
The Research Institute of Advanced Technologies;
Ningbo University;
Ningbo 315211;
China;
Key Laboratory of Photoelectric Detecting Materials and Devices of Zhejiang Province;
Ningbo 31521;
China;
Ningbo Institute of ceangraphy;
Ningbo University;
Ningbo 315211;
China;
Engineering Research Center for Advanced Infrared Photoelectric Materials and Devices of Zhejiang Province;
Ningbo 315211;
China;
antimony selenide films; photoelectric properties; Levenberg–Marquardt method and spectral fitting method(LM–SFM); microstructure;