The optical and structural properties of high-quality epitaxial Zn1-x Mgx O films deposited by pulsed-laser deposition ( PLD) were studied. Zn1-x Mgx O films with ~45% Mg incorporation were measured by EDS ( Energy dispersive spectroscopy) . XRD ( X-ray diffraction) measurement results show that Zn0. 55 Mg0. 45 O films have a cubic phase structure without phase separation and are epitaxial grown along the c-axis of Al2 O3 substrate. In the films, in-tense UVB optical pumped stimulated emission of this pure cubic-phase ZnMgO can be observed. The lasing threshold is about 22 kW/cm2 . Lasing occurs at UVB wavelength of ~310 nm under optical pumping.%利用脉冲激光沉积(PLD)设备在蓝宝石衬底上制备了高质量Zn1-xMgxO单晶薄膜,并对其结构和光学特性进行了深入细致的研究.通过能量衍射谱(EDS)确认Zn1-xMgxO薄膜的Mg组分为45%.在Zn0.55Mg0.45O薄膜的X射线衍射谱(XRD)中观测到了明显的位于36.67°的衍射峰,对应的是(111)晶向的立方相ZnMgO.从透射光谱中可以看出,Zn0.55 Mg0.45 O具有陡峭的吸收边,没有发生相分离,在透射电镜图谱中也得到了证实.该ZnMgO薄膜还表现出了优异的光学特性,在Zn0.55 Mg0.45 O材料体系中实现了峰位位于310 nm的紫外光泵浦受激发射,其激光发射的阈值仅为22 kW/cm2.
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