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Study on Post Processing Method of Single Event Upset Data for ARM Processor Memory

机译:ARM处理器内存单事件刷新数据的后处理方法研究

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机译:Nanodevices are widely used in commercial fields because of their low power consumption and high integration.However,due to the decrease of the characteristic size,the sensitivity of single event effect is improved.Even in the ground applications,they begin to be sensitive to the secondary particles released by the decay of a small amount of radioactive materials in the packaging materials and the atmospheric neutrons.

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