Reverse Study of a Commercial SRAM with Areal Time SEU Analysis System

摘要

Reverse engineering has a significant infuence on the dissemination of technology in the electronics industry1.Single Event Upset(SEU)is one of the most common injection faults induced by energetic ions in integrated circuits(ICs),and it's attractive to utilize SEU as a reverse method because SEU is seriously affcted by the design layout of ICs.