任意周期激励函数的模拟电路测试激励优化设计

摘要

Using different test stimuli have an affect on (he testability of the circuit under test (CUT). According to the Fourier series expression theory, which is described as the periodic function can be decomposed into a direct current component and a series of sine functions,a new optimization method for test stimulus generation of analog circuit is proposed. In this method, the random stimulus function is used as the optimal object, the optimal target is to obtain the maximal distance of different classes of faulty samples in the kernel space, and the constraint conditions are designed on the base of the relationship of amplitude,frequency and phase between the input and the output of the CUT, so a linear optimal model is constructed with one target and multiple constraints. This method has general adaptability.The optimal test stimuli succeed in improving the diagnosis results.%模拟电路测试中不同的激励源会影响电路的可测性,本文根据任意周期函数可由傅立叶级数展开成一个直流分量和一系列正弦函数叠加的原理,设计一种新的基于任意周期激励函数的模拟电路测试激励优化方法.该方法以任意周期激励函数作为优化对象,以最大特征样本的核类间距离作为优化目标,分析待测电路输入输出信号的幅值、频率和相位关系作为约束条件,设计构建一个单目标多约束的线性数学优化模型.该方法具有普适性能,优化得到的测试激励信号提高了模拟电路故障诊断性能.