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Dynamic fault modeling, physical software design concepts, and IC object recognition.

机译:动态故障建模,物理软件设计概念和IC对象识别。

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摘要

Issues surrounding integrated circuit (IC) testing and those of testing large software systems have striking similarities. For large systems in either domain, design for testability (DFT) is key. The single-stuck-at fault model in common use is widely believed to catch many of other kinds of faults. We present an efficient algorithm for generating minimal-length address-sequences for the detection of transition faults in semiconductor read-only memories (ROMs); experimental results demonstrate the inadequacy of the single-stuck-at fault model. We then describe a general, distributable, fault model for zero-delay, gate-level sequential circuit simulation, based on finite state machines (FSMs) described as flow tables; we show how this new model detects "weak" and "leaky" transistors in arbitrary gate-level circuits. Levelization of gates in a circuit simulation can be applied to physical modules in software. We show that a software system implemented as an acyclic graph of atomic primitive modules called components will be testable hierarchically without having to pay for extra "on-chip circuitry" nor render the encapsulation transparent. Treating the component as the fundamental unit of design, we described how to readily infer potential physical dependencies among components directly from the high-level logical relationships (e.g., IsA and Uses) among the logical entities (e.g., classes and functions) these components contain. We describe an important new metric Cumulative Component Dependency (CCD) for characterizing the maintainability and reusability of a software system based on its component dependency graph. We provide a suite of effective new techniques for reducing compile- and especially link-time dependencies among components. Finally the ability to recognize polygon-based IC layout as a collection of objects representing circuit elements connected by path-based wires, enables existing designs implemented using an older fabrication process to be reimplanted quickly in a new process. We describe in detail a novel solution to this complex problem, and present its successful implementation as proof of the efficacy of sound physical design practices in large software systems.
机译:围绕集成电路测试和大型软件系统测试的问题具有惊人的相似性。对于任一领域的大型系统,可测试性(DFT)设计都是关键。普遍认为,单故障模式可以捕获许多其他类型的故障。我们提出了一种有效的算法,用于生成最小长度的地址序列,以检测半导体只读存储器(ROM)中的过渡故障。实验结果证明了单陷故障模型的不足。然后,我们基于描述为流表的有限状态机(FSM),描述用于零延迟,门级时序电路仿真的常规,可分配故障模型。我们展示了这种新模型如何检测任意门级电路中的“弱”和“漏电”晶体管。电路仿真中门的均衡可以应用于软件中的物理模块。我们展示了实现为称为组件的原子原始模块的无环图的软件系统将可以进行分层测试,而不必支付额外的“片上电路”,也不必使封装透明。将组件视为设计的基本单元,我们描述了如何直接从这些组件包含的逻辑实体(例如,类和函数)之间的高级逻辑关系(例如,IsA和Uses)直接推断组件之间的潜在物理依赖性。 。我们描述了一个重要的新度量标准累积组件依赖关系(CCD),用于基于其组件依赖关系图表征软件系统的可维护性和可重用性。我们提供了一套有效的新技术,以减少组件之间的编译时(尤其是链接时)依赖性。最终,将基于多边形的IC布局识别为代表通过基于路径的导线连接的电路元件的对象集合的能力,使得使用较旧的制造工艺实现的现有设计可以在新工艺中快速重新植入。我们将详细描述解决此复杂问题的新颖方法,并介绍其成功实施,以证明大型软件系统中合理的物理设计实践的有效性。

著录项

  • 作者

    Lakos, John Stuart.;

  • 作者单位

    Columbia University.;

  • 授予单位 Columbia University.;
  • 学科 Computer Science.;Mathematics.;Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 1997
  • 页码 380 p.
  • 总页数 380
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:49:06

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