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Design and applications of a cryo-cooled scanning SQUID microscope.

机译:低温冷却扫描SQUID显微镜的设计和应用。

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摘要

I have designed, built and tested a cryo-cooled scanning SQUID microscope for imaging room-temperature samples, which uses a commercially available closed-cycle refrigerator to cool a high-Tc YBa2Cu 3O7-delta dc SQUID to 76 K. The system uses a custom dewar design for a minimum SQUID-sample separation of 50 mum. The flux white noise is 10.5 muphi0/Hz1/2 above 1 kHz. Below 1 kHz, 1/f noise is dominant, reaching 160 muphi0/HZ 1/2 at 10 Hz.;I used the microscope to perform non-destructive fault isolation on short circuits in modern microelectronic chips. Through a 120 mum thick silicon die, I isolated a power to ground plane short to within +/-100 mum at a SQUID-sample separation of 200 mum. In a multi-chip module package, I isolated a trace-to-trace short to within +/-18.5 mum at a SQUID-sample separation of 340 mum. These results helped lead to the successful commercialization of a SQUID microscope based upon my system. Using one of these commercial systems, I trained technical personnel and performed short-circuit fault isolation research at a major microelectronic manufacturer.;I also used the microscope for non-destructive evaluation of defects in low-Tc NbTi wires, comparing injected current vs. eddy current techniques. I found that the phase of the eddy currents was much less sensitive to geometry effects of both the sample and the defect when imaging fabricated test samples. I discovered that imaging injected currents with a SQUID oriented to detect the x-component of magnetic field produced a strong response to a defect in a NbTi wire, while the z-oriented SQUID produced no observable response to this defect.;I developed analysis techniques for calculating the magnetic pole density rho M, magnetic field H&ar; and magnetization M&ar; from images of Bz from in-plane magnetized samples. I used these techniques to screen sputtered magnetic combinatorial libraries of rare earth compounds. I found at least one interesting new compound, Fe11 Nd10Bx, which exhibited anisotropic characteristics and a remanent magnetization of at least 416 emu/cc. Finally, I developed a technique for making zero-applied-field non-remanent magnetization measurements, which would be useful to screen for the highest energy product (B*H) max of samples in magnetic combinatorial libraries.
机译:我已经设计,制造和测试了用于对室温样品进行成像的低温扫描SQUID显微镜,该显微镜使用市售的闭环制冷机将高Tc YBa2Cu 3O7-delta dc SQUID冷却至76K。定制杜瓦瓶设计,最小SQUID样品分离为50毫米。通量白噪声在1 kHz以上为10.5 muphi0 / Hz1 / 2。在1 kHz以下,1 / f噪声占主导地位,在10 Hz时达到160 muphi0 / HZ 1/2。我使用显微镜对现代微电子芯片中的短路进行无损故障隔离。通过一个120微米厚的硅芯片,我以200微米的SQUID采样间隔将电源隔离到接地层,短路至+/- 100微米以内。在多芯片模块封装中,我以340微米的SQUID采样间隔将迹线间的短路线隔离到+/- 18.5微米以内。这些结果有助于使基于我的系统的SQUID显微镜成功商业化。使用其中一种商用系统,我培训了技术人员,并在一家主要的微电子制造商处进行了短路故障隔离研究。我还使用显微镜对低Tc NbTi导线中的缺陷进行了无损评估,比较了注入电流与注入电流。涡流技术。我发现,在对制作的测试样品进行成像时,涡流的相位对样品和缺陷的几何效应都不太敏感。我发现用取向为检测磁场的x分量的SQUID成像注入的电流对NbTi导线中的缺陷产生了强烈的响应,而z取向的SQUID对这种缺陷没有产生可观察到的响应。用于计算磁极密度rho M,磁场H&ar;磁化M&ar;来自平面磁化样本中Bz的图像。我使用这些技术来筛选溅射的稀土化合物的磁性组合库。我发现至少一种有趣的新化合物Fe11 Nd10Bx,具有各向异性和至少416 emu / cc的剩余磁化强度。最后,我开发了一种用于进行零磁场非剩余磁化强度测量的技术,该技术可用于筛选磁性组合库中样品的最高能量乘积(B * H)max。

著录项

  • 作者

    Fleet, Erin Franklin.;

  • 作者单位

    University of Maryland, College Park.;

  • 授予单位 University of Maryland, College Park.;
  • 学科 Engineering Electronics and Electrical.;Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2000
  • 页码 234 p.
  • 总页数 234
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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