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Evaluation of Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory with disjoining-pressure and film-conductance measurements of surfactant stabilized free foam films.

机译:用分离力和表面活性剂稳定的自由泡沫膜的膜电导率测量值评估Derjaguin,Landau,Verwey和Overbeek(DLVO)理论。

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We develop a unique film holder combining the thin-film balance with AC impedance spectroscopy to measure simultaneously disjoining pressure, film conductance, and film thickness. Foam films stabilized by sodium dodecyl sulfate (SDS) are investigated with and without added sodium chloride (NaCl) electrolyte. Classical colloidal theory, Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory, is tested over a wide range of solution conditions by comparing the effective surface-charge density values fit to disjoining-pressure isotherms, estimated from surface tension, and inferred from film conductance. To reconcile the different values of effective surface charge density calculated from surface tension and film conductance, we propose that the surfactants adsorbed at the film interface are partially complexed with counterions. We develop a mass-action model, incorporating ion-binding, to predict the effective surface-charge density at the diffuse double layer. Our ion-binding model predicts that the degree of ion binding increases with increasing ionic strength as shown by the fits to the film-conductance data. However, we find it is not possible to describe the trends in the disjoining-pressure data because the DLVO model fits indicate that the effective surface-charge density increases, or ion binding decreases, with increasing ionic strength. Additional film-conductance measurements of Newton-black films indicate these surfactant ions and counterions retain 15% to 24% of their bulk mobility.
机译:我们开发了一种独特的薄膜固定器,该薄膜固定器将薄膜天平与交流阻抗谱相结合,可以同时测量分离压力,薄膜电导率和薄膜厚度。研究添加和不添加氯化钠(NaCl)电解质的十二烷基硫酸钠(SDS)稳定的泡沫膜。经典的胶体理论,Derjaguin,Landau,Verwey和Overbeek(DLVO)理论,通过比较有效表面电荷密度值与分离压力等温线拟合得到的测试结果,在广泛的溶液条件下进行了测试,这些值是根据表面张力估算得出的,并根据电影电导。为了调和由表面张力和薄膜电导计算出的有效表面电荷密度的不同值,我们建议吸附在薄膜界面上的表面活性剂与抗衡离子部分配合。我们开发了一个结合了离子键的质量作用模型,以预测扩散双层的有效表面电荷密度。我们的离子结合模型预测,离子结合的程度会随着离子强度的增加而增加,如对膜电导数据的拟合所示。但是,我们发现不可能描述分离压力数据的趋势,因为DLVO模型拟合表明有效表面电荷密度随离子强度的增加而增加,或离子结合力降低。牛顿黑膜的其他膜电导测量表明,这些表面活性剂离子和抗衡离子保留了其整体迁移率的15%至24%。

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