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Defect Analysis and Optimization of the Indium Oxide (Zinc Oxide) System for Energy Applications.

机译:用于能源应用的氧化铟(氧化锌)系统的缺陷分析和优化。

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摘要

The defect chemistry of compounds in the In2O3(ZnO) k system (k = 3, 5, 7, and 9) was investigated via analysis of the dependence of conductivity on oxygen partial pressure at high temperature (750°C). Defect mechanisms were proposed based on the resulting Brouwer slopes, and the presence of two defect regimes was attributed to competition between In 2O3--like (k = 3) and ZnO--like behavior (k = 5, 7, 9). The donor in both cases is proposed to be the In antisite defect ( In•Zn ). To support the validity of the proposed models, density functional theory was used to calculate the formation energies of the proposed defects.;X-ray and ultraviolet photoelectron spectroscopy studies were performed on the surfaces of thin film (k = 2) and bulk specimens (k = 3, 5, 7, and 9) to investigate their work functions, Fermi levels, and ionization potentials. The work functions and Fermi levels for all samples fell on a line of constant ionization potential (∼7.7--7.8 eV), which was independent of composition and unchanged by oxidation and reduction treatments. This ionization potential was very close to those of oxidized In2O3 and ZnO surfaces. The work functions of each sample were similar when measured under vacuum or ambient conditions (4.7--4.9 eV).;The high-temperature (750°C) electrical conductivity and thermopower of bulk samples of In2O3(ZnO)k were analyzed to assess their potential for use in thermoelectric power applications. The density of states-mobility products were determined by Jonker analysis (thermopower vs. ln conductivity) of the measured electrical properties. Ioffe analysis (log-log plots of maximum power factor vs. density of states-mobility product) was employed to predict the maximum thermoelectric power factor that could be achieved for each compound with an optimized carrier concentration, which agreed well with the best performances reported in the literature. The maximum predicted power factors were similar for the k = 1--7 phases, between 2 and 15x10-4 W/mK2, and were comparable to those of other n-type thermoelectric oxides. The predicted power factors were much lower for the k = 9 phase.
机译:通过分析高温(750°C)下电导率对氧分压的依赖性,研究了In2O3(ZnO)k系统(k = 3、5、7和9)中化合物的缺陷化学。根据产生的布劳尔斜率提出了缺陷机理,并且两种缺陷态的存在归因于类In 2O3(k = 3)和类ZnO行为(k = 5、7、9)之间的竞争。两种情况下的供体均被认为是In反位缺陷(In•Zn)。为了支持所提出模型的有效性,使用密度泛函理论计算了所提出缺陷的形成能。;对薄膜(k = 2)和大块试样的表面进行了X射线和紫外光电子能谱研究( k = 3、5、7和9)来研究其功函数,费米能级和电离势。所有样品的功函数和费米能级均处于恒定电离势线(〜7.7--7.8 eV)上,该电势与组成无关,并且在氧化和还原处理后不变。该电离势非常接近于氧化的In2O3和ZnO表面。在真空或环境条件(4.7--4.9 eV)下测量时,每个样品的功函数相似。;分析了In2O3(ZnO)k散装样品的高温(750°C)电导率和热功率,以评估它们在热电应用中的潜力。态迁移率乘积的密度通过所测电性能的Jonker分析(热功率与ln电导率)确定。离子流分析(最大功率因数与状态-迁移率密度的对数-对数图)被用来预测每种化合物在最佳载流子浓度下可达到的最大热电功率因数,与报告的最佳性能非常吻合在文学中。 k = 1--7相的最大预测功率因数相似,介于2和15x10-4 W / mK2之间,并且可与其他n型热电氧化物相媲美。对于k = 9相,预测的功率因数要低得多。

著录项

  • 作者

    Hopper, E. Mitchell.;

  • 作者单位

    Northwestern University.;

  • 授予单位 Northwestern University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2011
  • 页码 160 p.
  • 总页数 160
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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