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The effects of helium on deuterium retention in tungsten under simultaneous irradiation.

机译:氦气在同时照射下对钨中氘保留的影响。

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摘要

The trapping behavior of deuterium and helium in polycrystalline tungsten (PCW) under D+-only, He+-only, sequential and simultaneous irradiation was studied as a function of incident ion fluences and irradiation temperature. Deuterium implanted at 300 and 500 K gets trapped at surface adsorption sites, vacancy-related traps, or extended defects. No deuterium was trapped for 700 K implantations. Results were affected by tungsten-carbide impurities in PCW specimens. It is suggested that He trapping occurs via the formation of He clusters, at impurity sites, or as part of He-vacancy complexes. For sequential implantations, D and He were found to de-trap each other, with He impeding the trapping of D when implanted first at 300 K. Under simultaneous irradiation a decrease in D inventories was observed for all cases, and a re-distribution of He to higher energy traps (associated with He-vacancy complex formation) was observed for higher fluences and temperatures.
机译:研究了氘和氦在纯D +,仅He +,顺序和同时照射下的俘获行为,其与入射离子通量和照射温度的关系。以300和500 K注入的氘被困在表面吸附位点,空位相关的陷阱或缺陷扩展处。对于700 K植入,没有捕获氘。结果受到PCW样品中碳化钨杂质的影响。建议通过在杂质位点或作为He空位络合物的一部分形成He团簇来发生He捕获。对于顺序植入,发现D和He相互俘获,当He首次以300 K植入时,He阻碍了D的俘获。在同时照射下,所有情况下D的存量均减少,并且D的重新分布观察到他到更高的能量陷阱(与氦空位复合物的形成有关)具有更高的能量密度和温度。

著录项

  • 作者单位

    University of Toronto (Canada).;

  • 授予单位 University of Toronto (Canada).;
  • 学科 Engineering Aerospace.
  • 学位 M.A.Sc.
  • 年度 2011
  • 页码 101 p.
  • 总页数 101
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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