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Design and fabrication of a small-scale thin film strain gauge.

机译:小型薄膜应变仪的设计与制造。

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摘要

The miniaturization of force or pressure sensors requires miniaturization of thin film strain gauge by the application of microfabrication techniques. A miniature strain gauge was designed, fabricated by microlithographic lift-off technique and tested.; Nichrome (Ni-Cr 80/20 wt%) was chosen as the material for the strain gauge. The electromechanical properties of nichrome films were evaluated. Based on these properties, miniature strain gauges were designed. The design value of the width of the resistance path, i.e., gridline of the strain gauge is 20 mum and the overall size of the grid is 100 mum x 140 mum. The ratio of longitudinal resistance to total resistance of the gauge is 0.727. The gauges were designed for two different thicknesses, i.e. 25 and 50 nm.; The strain gauges were first fabricated on glass substrates and tested. After initial success on glass substrates, the gauges were deposited on steel substrates coated with .5 mum thick alumina films and tested. The gauges were found to work well.; The widths of the resistance paths were generally larger than the design value of 20 mum, typically 22--28 mum, because of limitations of the fabrication technique. This caused a reduction of the resistance of the deposited gauges to 70--82% of the design values. The design of the measurement circuit reduced the ratio of longitudinal to total resistance and thus reduced the gauge factor of the deposited gauges to 86--87% of the design values. After adjusting for the design values of the width and the ratio of longitudinal to total resistance, the results agreed closely with the respective design values.
机译:力或压力传感器的小型化需要通过微加工技术的应用来使薄膜应变仪小型化。设计了一种微型应变仪,通过微光刻剥离技术制造并进行了测试。选择镍铬合金(Ni-Cr 80/20 wt%)作为应变仪的材料。评估了镍铬合金薄膜的机电性能。基于这些特性,设计了微型应变仪。电阻路径的宽度(即应变仪的网格线)的设计值为20微米,网格的整体大小为100微米x 140微米。量规的纵向电阻与总电阻之比为0.727。量规设计用于两种不同的厚度,即25和50 nm。首先将应变仪安装在玻璃基板上并进行测试。在玻璃基板上取得初步成功后,将仪表放置在涂有0.5微米厚氧化铝膜的钢基板上并进行测试。发现压力表工作良好。由于制造技术的限制,电阻路径的宽度通常大于20微米的设计值,通常为22--28微米。这导致沉积仪表的电阻降低到设计值的70--82%。测量电路的设计降低了纵向电阻与总电阻的比值,从而将沉积的仪表的仪表系数减小到设计值的86--87%。在调整宽度和纵向电阻与总电阻之比的设计值之后,结果与各个设计值非常吻合。

著录项

  • 作者

    Imam, Kazi H.;

  • 作者单位

    Queen's University at Kingston (Canada).;

  • 授予单位 Queen's University at Kingston (Canada).;
  • 学科 Engineering Mechanical.; Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 236 p.
  • 总页数 236
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 机械、仪表工业;
  • 关键词

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