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Nanometer-scale structural and electronic properties of low dimensional heterostructures.

机译:低维异质结构的纳米尺度结构和电子性质。

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摘要

Mercury cadmium telluride (MCT) based heterostructures and InAs/GaAs quantum dots have enabled significant advances in optoelectronic devices such as light emitters and detectors. In both cases, the atomic-scale structural and electronic properties of the heterostructure interfaces remain the least understood aspect of the devices. Further advances will require an improved understanding of issues such as interface abruptness, alloy non-uniformities, and local band-offsets. In this dissertation, the nanometer-scale structural and electronic properties of II-VI substrates and InAs/GaAs dots are investigated using a combination of cross-sectional scanning tunneling microscopy (XSTM) and variable separation scanning tunneling spectroscopy (STS).;The influence of crystal orientation and thickness on the cleavage of CdTe and Cd1--xZnxTe substrates, as well as the influence of In doping and annealing on the substrate resistivity are explored. The flattest cleaves were obtained for 900 microm thick (111) CdTe and Cd 1--xZnxTe wafers cleaved along [110]. Furthermore, after In-doping (n ∼ 2.2 x 1017 cm -3) and post-growth annealing (T = 750 °C) in a Cd-rich environment, the CdTe substrate resistivity was reduced to 0.04 O-cm, and XSTM measurements were performed.;The influence of surrounding In0.2Ga0.8As alloy layers on the size and distribution of InAs/GaAs dots, as well as the thickness of the surrounding wetting layer (WL) are examined. XSTM images reveal that the surrounding alloy layers promoted a 38% (71%) increase in average dot diameter (height), and a three-fold increase in WL thickness. A strain-based mechanism for dot formation and collapse in the absence and presence of alloy buffer and capping layers is proposed.;The origins of electronic states in individual, uncoupled dots and the surrounding WL are investigated using a combination of XSTM and STS. Room temperature STS spectra reveal a gradient in the effective bandgap within the dots with smallest values near the dot core and top surfaces. The variations in effective bandgap are apparently dominated by indium composition gradients, with minimal effects due to dot shape and strain. Indium composition gradients also dominate the effective bandgap variations in the WL.
机译:基于碲化汞镉(MCT)的异质结构和InAs / GaAs量子点已使光电器件(例如发光器和检测器)取得了显着进步。在这两种情况下,异质结构界面的原子尺度结构和电子特性仍然是器件中最难理解的方面。进一步的进步将需要对诸如界面突变,合金不均匀和局部带偏移之类的问题有更好的理解。本文结合截面扫描隧道显微镜(XSTM)和可变分离扫描隧道光谱法(STS)研究了II-VI衬底和InAs / GaAs点的纳米尺度结构和电子性能。研究了晶体取向和厚度对CdTe和Cd1-xZnxTe衬底解理的影响,以及In掺杂和退火对衬底电阻率的影响。对于沿[110]切割的900微米厚(111)的CdTe和Cd 1-xZnxTe晶片,获得了最平坦的切割。此外,在富Cd环境中进行In掺杂(n〜2.2 x 1017 cm -3)和生长后退火(T = 750°C)之后,CdTe衬底的电阻率降低到0.04 O-cm,并进行XSTM测量研究了In0.2Ga0.8As周围合金层对InAs / GaAs点的尺寸和分布以及周围润湿层(WL)厚度的影响。 XSTM图像表明,周围的合金层促使平均点直径(高度)增加了38%(71%),而WL厚度增加了三倍。提出了一种在不存在和存在合金缓冲层和覆盖层的情况下,基于应变的点形成和坍塌的机制。;结合XSTM和STS,研究了各个未耦合点和周围WL中电子态的起源。室温STS光谱显示点内有效带隙中的梯度,在点核心和顶面附近的最小值。有效带隙的变化显然受铟组成梯度的控制,由于点的形状和应变,其影响最小。铟组成梯度也主导了WL中的有效带隙变化。

著录项

  • 作者

    Dasika, Vaishno Devi.;

  • 作者单位

    University of Michigan.;

  • 授予单位 University of Michigan.;
  • 学科 Engineering Electronics and Electrical.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 142 p.
  • 总页数 142
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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