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Arcing failure of RoHS compliant electromagnetic relays.

机译:符合RoHS的电磁继电器起弧故障。

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摘要

Electronic relay contacts have traditionally been made of materials, primarily Ag/CdO, which are resistant to welding under short, high power pulses. However, since 2006, RoHS prohibits the use of cadmium in electronics, driving the elimination of Ag/CdO and its replacement with Ag/SnO 2. The reliability of relays made with Ag/SnO2 contacts has been shown to be vendor specific. This thesis focuses on developing an understanding of the metallurgical and design factors that vary by manufacturer and their effect on welding susceptibility of Ag/SnO2 electromagnetic relay contacts and other related relay failure mechanisms. In addition, it aims to predict a safe operating area of power and energy over which specific relay contacts will not weld under high power DC conditions.;Relays from various manufacturers were subjected to capacitor discharge pulses of 250 V at 10-80 microF to characterize relay reliability. Failure analysis was then conducted on the welded contacts using scanning electron microscopy (SEM) and wavelength-dispersive spectroscopy (WDS) in order to address material properties and design variations that affect the welding susceptibility of relays. The incidence and extent of degradation is correlated to material characteristics including contact composition, oxide content, hardness, contact geometry, and surface roughness using a physics of failure approach. The relays with a higher percent content of indium oxide exhibited a greater reliability than those without. Both power and energy were then varied to further investigate the one cycle to failure boundary region and a failure map is presented.
机译:传统上,电子继电器触点由主要是Ag / CdO的材料制成,这种材料可抵抗短时高功率脉冲的焊接。但是,自2006年以来,RoHS禁止在电子产品中使用镉,这驱使人们淘汰了Ag / CdO,并用Ag / SnO 2代替了它。事实证明,用Ag / SnO2触点制成的继电器的可靠性是特定于厂商的。本文的重点是发展对因制造商而异的冶金和设计因素及其对Ag / SnO2电磁继电器触头和其他相关继电器故障机理的焊接敏感性的影响的理解。此外,它的目的是预测在大功率直流条件下特定继电器触点将不会焊接的功率和能量的安全工作区域。;来自各个制造商的继电器在10-80 microF的电压下经受了250 V的电容器放电脉冲以表征继电器可靠性。然后使用扫描电子显微镜(SEM)和波长色散光谱(WDS)对焊接触点进行故障分析,以解决影响继电器焊接敏感性的材料特性和设计变化。使用失效物理方法,降解的发生率和程度与材料特性相关,包括触点组成,氧化物含量,硬度,触点几何形状和表面粗糙度。氧化铟含量较高的继电器比没有的继电器具有更高的可靠性。然后改变功率和能量以进一步研究到故障边界区域的一个周期,并给出故障图。

著录项

  • 作者

    Boettcher, Robert Donald.;

  • 作者单位

    University of Maryland, College Park.;

  • 授予单位 University of Maryland, College Park.;
  • 学科 Engineering Mechanical.;Engineering Electronics and Electrical.
  • 学位 M.S.
  • 年度 2012
  • 页码 114 p.
  • 总页数 114
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:42:37

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