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Design verification for sequential systems at various abstraction levels.

机译:在各种抽象级别对顺序系统进行设计验证。

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摘要

With the ever increasing complexity of digital systems, functional verification has become a daunting task to circuit designers. Functional verification alone often surpasses 70% of the total development cost and the situation has been projected to continue to worsen. The most critical limitations of existing techniques are the capacity issue and the run-time issue.; This dissertation addresses the functional verification problem using a unified approach, which utilizes different core algorithms at various abstraction levels.; At the logic level, we focus on incorporating a set of novel ideas to existing formal verification approaches. First, we present a number of powerful optimizations to improve the performance and capacity of a typical SAT-based bounded model checking framework. Secondly, we present a novel method for performing dynamic abstraction within a framework for abstraction-refinement based model checking. Experiments on a wide range of industrial designs have shown that the proposed optimizations consistently provide between 1--2 orders of magnitude speedup and can be extremely useful in enhancing the efficacy of existing formal verification algorithms.; At the register transfer level, where the formal verification is less likely to succeed, we developed an efficient ATPG-based validation framework, which leverages the high level circuit information and an improved observability-enhanced coverage to generate high quality validation sequences. Experiments show that our approach is able to generate high quality validation vectors, which achieve both high tag coverage and high bug coverage with extremely low computational cost.
机译:随着数字系统日益复杂,功能验证已成为电路设计人员的艰巨任务。仅功能验证通常会超过总开发成本的70%,而且预计情况还会继续恶化。现有技术最关键的限制是容量问题和运行时间问题。本文采用统一的方法解决了功能验证问题,该方法在不同的抽象层次上利用了不同的核心算法。在逻辑层面上,我们专注于将一组新颖的想法整合到现有的形式验证方法中。首先,我们提出了许多强大的优化措施,以提高典型的基于SAT的边界模型检查框架的性能和容量。其次,我们提出了一种用于在基于抽象优化的模型检查的框架内执行动态抽象的新颖方法。在广泛的工业设计上进行的实验表明,所提出的优化始终如一地提供了1--2个数量级的加速,并且对于增强现有形式验证算法的有效性非常有用。在正式验证不太可能成功的寄存器转移级别,我们开发了一个有效的基于ATPG的验证框架,该框架利用高级电路信息和改进的可观察性增强的覆盖范围来生成高质量的验证序列。实验表明,我们的方法能够生成高质量的验证向量,从而以极低的计算成本实现高标签覆盖率和高错误覆盖率。

著录项

  • 作者

    Zhang, Liang.;

  • 作者单位

    Virginia Polytechnic Institute and State University.;

  • 授予单位 Virginia Polytechnic Institute and State University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 139 p.
  • 总页数 139
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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