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Optimization for finite element modeling of electronic components under dynamic loading.

机译:动态载荷下电子元件有限元建模的优化。

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摘要

Usage of electronic components in the U.S. ARMY applications is becoming more challenging due to their usage in harsh environments. Experimental verification of these components is expensive and it can yield information about specific locations only. This research outlines the finite element modeling methodology for these electronic components that are subjected to high acceleration loads that occur over extremely short time such as impact, gun firing and blast events. Due to their miniature size these finite element models are computationally expensive. An optimization engine was presented to have an efficient analysis procedure that provides a combination of accuracy, computational speed and modeling simplicity. This research also involves experimental testing of the electronic components mounted on the circuit boards. Testing was conducted at different strain levels in order to study the behavior of boards. Finite element models were developed for these tests and compared with experimental results.
机译:由于在恶劣的环境中使用电子组件,因此在美国陆军应用中使用电子组件变得越来越具有挑战性。这些组件的实验验证非常昂贵,并且只能产生有关特定位置的信息。这项研究概述了这些电子元件的有限元建模方法,这些电子元件承受在极短时间内发生的高加速度载荷,例如冲击,枪击和爆炸事件。由于它们的微型尺寸,这些有限元模型的计算量很大。提出了具有优化分析程序的优化引擎,该分析程序提供了准确性,计算速度和建模简单性的组合。这项研究还涉及对安装在电路板上的电子组件进行实验测试。为了研究电路板的性能,在不同的应变水平下进行了测试。针对这些测试开发了有限元模型,并将其与实验结果进行了比较。

著录项

  • 作者

    Sridharala, Srujanbabu.;

  • 作者单位

    University of Nevada, Las Vegas.;

  • 授予单位 University of Nevada, Las Vegas.;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 145 p.
  • 总页数 145
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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