首页> 外文会议>World Multiconference on Systemics, Cybernetics and Informatics v.10: Mobile/Wireless Computing and Comunication Systems II; 20020714-20020718; Orlando,FL; US >Swept-Wavelength Laser Measurement Systems Enable Real-Time Monitoring and In-Process Control During Optical Manufacturing
【24h】

Swept-Wavelength Laser Measurement Systems Enable Real-Time Monitoring and In-Process Control During Optical Manufacturing

机译:扫频激光测量系统可在光学制造过程中实现实时监控和过程中控制

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

High-speed and high-accuracy swept-wavelength laser systems are demonstrated to enable in-process characterization, control, and testing for optical manufacturing. Real-time amplitude and dispersion spectral measurements of optical components and modules are very useful not only for fast device characterization, but also real-time monitoring during device fabrication to enhance process flexibility and device performance, as well as optimization of final device packaging process. This high-speed measurement platform opens the door to a variety of real-time applications in optical development and manufacturing, as well as the related field of optical sensing.
机译:演示了高速,高精度扫频激光系统,可以进行光学制造的过程中表征,控制和测试。光学组件和模块的实时幅度和色散光谱测量不仅对于快速表征器件非常有用,而且在器件制造过程中进行实时监控以增强工艺灵活性和器件性能,以及优化最终器件封装工艺也非常有用。这个高速测量平台为光学开发和制造以及光学传感相关领域的各种实时应用打开了大门。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号