Interconnect Modeling Using Integrated Time-Domain and Frequency-Domain Techniques

摘要

This paper presents an integrated time-and-frequency-domain technique for characterization and modeling of parasitic effects associated with interconnects. This technique enables direct measurements of critical transient as well as frequency responses of interconnects; accurate and efficient SPICE model extraction for coupled lines; and cross-domain verification of the measured data as well as the extracted models. To illustrate its application this technique is applied to characterize and extract the equivalent circuit model of the I/O bus on a real-world printed circuit board.