Automated Crystal Orientation Mapping (ACOM) with a Computer- Controlled TEM by Interpreting Transmission Kikuchi Patterns

摘要

A system for acquisition and interpretation of transmission Kikuchi patterns with a computer-controlled PHILIPS EM 430 TEM is presented it enables interactive as well as fully automated determination of individual grain orientations using digital beam scan for ACOM operation. A high-grade integrating CCD camera is mounted on-axis on the bottom flange of the microscope column. Image resolution is 1,024 by 1,024 pixels, the dynamic range is 14 bit With the present setup more than 3,000 orientations can be measured unattendedly per hour.