A Hierarchical Modeling and Fault Diagnosis Technique for Complex Electronic Devices

摘要

Due to the shortcomings of the diagnosis systems presently used by complex electronic devices system such as failure models hard to build and low fault isolation resolution, a new hierarchical Modeling and diagnosis technique is proposed based on multisignal model and support vector machine (SVM). Multisignal model is used to describe the failure propagation relationship in electronic device system, and the most probable failure printed circuit boards (PCBs) or circuit modules are reasoned by max Bayes postior probability. The exact failure modes/components in the PCB/Module can be identified by SVM. The results show the proposed modeling and diagnosis methods are effective and are suitable for complex electronic devices diagnosis.