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Utilization of optical wood chip analyzer in pulping and chipping process

机译:光学木屑分析仪在制浆和切片过程中的应用

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Wood chip analyses have traditionally utilized the TAPPI and SCAN mechanical test methods. Although hand-sorting chips is the most accurate method of measuring chip size distribution, it is labor-intensive and time-consuming. Consequently, the test results are not used in online process control. Mechanical devices that simulate hand-sorting chips are typically used to improve productivity and practicality. However, these devices introduce result variability and are expensive to maintain due to component wear life and calibration problems. Measuring devices based on machine vision can be used to measure all three dimensions of the wood chip simultaneously. The result is width, length and thickness distributions from a test sample of wood chips that can present results in various forms. The results can be sorted to emulate a TAPPI or SCAN report or they can be configured to provide customized reports to assist in studying specific issues. A chip quality analyzer can be equipped with an automated sampler to provide continuous analysis of chip flow to assist in monitoring the chipping process and purchased chip supply, or controlling digester parameters. Further, when the device is equipped with a special conveyor, several separate samples can be loaded on to the conveyor for automated analysis. This is a useful way to measure samples from various locations or to analyze the quality of purchased chips. Modern optical chip analyzers provide extremely accurate measurement of all the chips in the sample, quickly, with very low maintenance, and very little manpower. This paper presents an overview of an optical chip quality analyzer and three examples utilizing this technology.
机译:木屑分析传统上利用TAPPI和SCAN机械测试方法。尽管手动分选芯片是测量芯片尺寸分布的最准确方法,但它很费力且费时。因此,测试结果不会用于在线过程控制中。模拟手动分选芯片的机械设备通常用于提高生产率和实用性。但是,由于组件的磨损寿命和校准问题,这些设备引入了结果可变性,并且维护成本昂贵。基于机器视觉的测量设备可用于同时测量木片的所有三个尺寸。结果是来自木片测试样品的宽度,长度和厚度分布,可以以各种形式呈现结果。可以对结果进行排序以模拟TAPPI或SCAN报告,也可以将结果配置为提供自定义报告以帮助研究特定问题。芯片质量分析仪可以配备自动采样器,以提供对芯片流的连续分析,以帮助监视切屑过程和购买的芯片供应,或控制消化器参数。此外,当设备配备专用传送带时,可以将几个单独的样品装载到传送带上以进行自动分析。这是一种从各个位置测量样品或分析所购芯片质量的有用方法。现代光学芯片分析仪可快速,极少的维护和极少的人力提供对样品中所有芯片的极其精确的测量。本文介绍了光学芯片质量分析仪的概述以及利用该技术的三个示例。

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