Synthesis of weighted random sequences with application to testingof sequential circuits

摘要

The weights are stored and a weighted random sequence generator isnused to produce the required test sequences during testing rather thannstoring the actual test sequence themselves. The generation of requirednweights is based on the dynamic scan algorithm, DYNASTEE. Experimentalnresults demonstrate tradeoffs in test application time and in testernmemory requirements, while maintaining 100% fault coverage of all targetnfaults