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The effect of a graded In profile on the figure of merit of PbTe

机译:分级的In轮廓对PbTe品质因数的影响

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The present study was aimed at demsonstrating the possibility of producing a graded charge carrier concentration in a PbTe crystal by taking advantage of the concentration profile that is set up by the diffusion of In from an external source. Doping by indium generates deep impurity levels lying close to the edge of the conduction band. The Fermi level pinning effect and the electron population of the In impurity levels, which reduces the minority carrier concentration at elevated temperature, significantly improve the thermoelectric beahvior of the resulting materials. The penetration profiles of In, orignating from an external gaseous or liquid source, were determined using Seebeck coefficient measurements in p-and n-type PbTe crystals. In the p-type crystal, the Seebeck coefficient changed sign as the In concentration induced a change from p-type to n-type character. The thermovoltage of a PbTe crystal in which an In concentration profile, generated by In diffusing from a gaseous source had been established, was determined in the 50 to 530 deg C temperature range. The constant Seebeck coefficient that was observed over the whole temperature range provides the experimental support for the underlying premises of this study.
机译:本研究旨在通过利用由外部源中In的扩散建立的浓度分布图来证明在PbTe晶体中产生分级的电荷载流子浓度的可能性。铟掺杂产生的深杂质水平接近导带的边缘。费米能级钉扎效应和In杂质能级的电子数量降低了高温下的少数载流子浓度,从而显着提高了所得材料的热电性能。使用Seebeck系数测量法在p型和n型PbTe晶体中确定了来自外部气体或液体源的In的渗透曲线。在p型晶体中,塞贝克系数随着In浓度引起从p型向n型的变化而改变符号。在50至530℃的温度范围内确定其中已经建立了由In从气体源扩散产生的In浓度分布的PbTe晶体的热电压。在整个温度范围内观察到的恒定塞贝克系数为该研究的基本前提提供了实验支持。

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