首页> 外文会议>Symposium on Science and Technology of Magnetic Oxides December 1-4, 1997, Boston, Massachusetts, U.S.A. >Room temperature magnetoresistive response in CMR perovskite manganite thin films
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Room temperature magnetoresistive response in CMR perovskite manganite thin films

机译:CMR钙钛矿锰矿薄膜的室温磁阻响应

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Perovskite-structured La_xSr_yMnO_3 thin-films have been deposited onto LaAlO_34 substrates via liquid delivery chemical vapor deposition (LD-CVD) using metal( beta -diketonato) precursors, M(the)_x [where M chemical bounds Ca, Sr, La and Mn, thd chemical bounds 2, 2, 6, 6-tetramethyl-3, 5-heptanedionato and x chemical bounds 2-3]. Tin films were dpeosited at temperatures between 500 and 700 deg C and subsequently annealed at 1000 deg C under O_2. These fils possess stocihiometries that are: i) vastly different from the La_(0.67)Sr_*0.33)MnO_3 compositions commonly reported in the literature and ii) display high temperature, low field responses that may be technologically important. Resistance versous temperature measurements revealed a metal to semiconductor transition at room temperature and above. Hall measurements on a film lf La_(0.35)Sr_(0.24)MnO_3 displayed a magnetorsistive response (MR) of-10
机译:钙钛矿结构的La_xSr_yMnO_3薄膜已使用金属(β-二酮酮)前体M(the_x [通过M结合Ca,Sr,La和Mn的化学反应)通过液体输送化学气相沉积(LD-CVD)沉积到LaAlO_34衬底上,thd化学范围2、2、6、6-四甲基-3、5-庚二酮和x化学范围2-3]。锡膜在500至700摄氏度的温度下进行消磁,然后在O_2下于1000摄氏度进行退火。这些滤膜具有以下结构:i)与文献中通常报道的La_(0.67)Sr_ * 0.33)MnO_3成分大不相同,以及ii)显示出高温,低场响应,这可能在技术上很重要。电阻与温度的测量表明,在室温及更高温度下,金属向半导体的转变。在La_(0.35)Sr_(0.24)MnO_3薄膜上的霍尔测量结果显示磁阻响应(MR)为-10

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