The optical properties of a polished uranium surface and its epitaxial oxide, and the rate of oxide growth determined by spectrophotometry

摘要

Wide-band reflectrometry and ellipsometry have been used to determine the optical properties n and k of freshly polished uranium and of the epitaxial oxide layer, and also the rate of oxide growth in air. Results for uranium metal as well as for epitaxial oxide are compared with single wavelength ellipsometry literature values.